Investigation of bonding strength between (InP, Si)/SiO2 and Si by Surface Activated Bonding based on Fast Atom Beam assisted by Si nano-film

Weicheng Fang, Yuning Wang, Tomohiro Amemiya, Nobuhiko Nishiyama. 第80回応用物理学会秋季学術講演会, 20a-E215-2, Sep. 2019.